Ieee Transactions On Device And Materials ReliabilitySCIE

英文簡(jiǎn)介Ieee Transactions On Device And Materials Reliability期刊介紹

The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectation. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.

期刊簡(jiǎn)介Ieee Transactions On Device And Materials Reliability期刊介紹

《Ieee Transactions On Device And Materials Reliability》自2001出版以來(lái)，是一本工程技術(shù)優(yōu)秀雜志。致力于發(fā)表原創(chuàng)科學(xué)研究結(jié)果，并為工程技術(shù)各個(gè)領(lǐng)域的原創(chuàng)研究提供一個(gè)展示平臺(tái)，以促進(jìn)工程技術(shù)領(lǐng)域的的進(jìn)步。該刊鼓勵(lì)先進(jìn)的、清晰的闡述，從廣泛的視角提供當(dāng)前感興趣的研究主題的新見(jiàn)解，或?qū)彶槎嗄陙?lái)某個(gè)重要領(lǐng)域的所有重要發(fā)展。該期刊特色在于及時(shí)報(bào)道工程技術(shù)領(lǐng)域的最新進(jìn)展和新發(fā)現(xiàn)新突破等。該刊近一年未被列入預(yù)警期刊名單，目前已被權(quán)威數(shù)據(jù)庫(kù)SCIE收錄，得到了廣泛的認(rèn)可。

該期刊投稿重要關(guān)注點(diǎn)：

• 預(yù)計(jì)審稿時(shí)間： 較慢,6-12周
• 工程技術(shù)
• ENGINEERING, ELECTRICAL & ELECTRONIC
• SCIE
• 中科院3區(qū)
• 非預(yù)警